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Abstracts. Meeting of JIM
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FIB/TEM Observation on Defect Structure of Si at DBTT.
FIB/TEM Observation on Defect Structure of Si at DBTT.
| Accession number;99A0489021 |
| Title;FIB/TEM Observation on Defect Structure of Si at DBTT. |
| Author; |
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Journal Title;Abstracts. Meeting of JIM |
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Journal Code:S0988A |
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ISSN:1342-5730 |
| VOL.124th;NO.;PAGE.417(1999) |
| Figure&Table&Reference; |
| Pub. Country;Japan |
| Language;English |
| Abstract; |
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| Copyright (c) 2006-2007 Japan Science and Technology Agency. All Rights Reserved. | |
