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Accession number;99A0562718
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| Title;Structure Analysis Introducing Partial Profile Relaxation and the Maximum-Entropy Method with Powder Diffraction Data. |
| Author;
IZUMI FUJIO
(Nat. Inst. for Res. in Inorganic Mater.)
IKEDA TAKUJI
(Univ. of Tsukuba, Inst. of Appl. Phys.)
KUMAZAWA SHINTARO
(Japan Atomic Energy Res. Inst., Advanced Sci. Res. Center, JPN)
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Journal Title;Journal of the Mineralogical Society of Japan
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Journal Code:G0124A
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ISSN:0454-1146
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VOL.28;NO.2;PAGE.57-63(1999)
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| Figure&Table&Reference;FIG.6, REF.17 |
| Pub. Country;Japan |
| Language;Japanese |
| Abstract;A Rietveld-refinement program, RIETAN-98, has two advanced features: partial profile relaxation and whole-pattern fitting based on a maximum-entropy method (MEM). Partial profile relaxation means that primary profile parameters of isolated reflections can be locally refined independently of secondary profile parameters. It was combined with three split-type profile functions to obtain better fits between observed and calculated patterns, particularly in samples showing anisotropic profile broadening, Further, RIETAN-98 has been combined with a MEED program for the MEM to grow into a joint software named REMEDY, which makes it possible to carry out MEM analysis and whole-pattern fitting alternately. REMEDY is very useful for modifying incomplete structural models and analyzing highly disordered structures. (author abst.) |
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