Science Links Japan | Precise Analysis of a Very Small Mineral by an X-Ray Diffraction Method.

Precise Analysis of a Very Small Mineral by an X-Ray Diffraction Method.

Accession number;99A0830389

Title;Precise Analysis of a Very Small Mineral by an X-Ray Diffraction Method.

Author; NAKAMUTA YOSHIHIRO (Kyushu Univ., Faculty of Science)

Journal Title;Journal of the Mineralogical Society of Japan

Journal Code:G0124A

ISSN:0454-1146

VOL.28;NO.3;PAGE.117-121(1999)

Figure&Table&Reference;FIG.3, REF.15

Pub. Country;Japan

Language;Japanese

Abstract;The resolution and precision of X-ray powder diffraction data of a silicon standard obtained by a Gandolfi camera were examined by comparing with those obtained by a diffractometer. The peak width (FWHM) and integral breadth of reflections obtained by a Gandolfi camera take vales similar to those obtained by a diffractometer. The reflections of a Gandolfi camera have symmetrical profiles in contrast to the asymmetric ones of a diffractometer. The peak positions can be determined with an error less than 0.01.DEG.(2.THETA.) even by using a Gandolfi camera. These results suggest that precise X-ray diffraction analysis can be made also for a very small mineral, 10-100.MU.m in size, by a Gandolfi camera. (author abst.)

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