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Accession number;99A0830390
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| Title;Synchrotron Radiation Induced X-ray Analyses of Earth and Planetary Materials. |
| Author;
NAKAI IZUMI
(Sci. Univ. of Tokyo, Fac. of Sci.)
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Journal Title;Journal of the Mineralogical Society of Japan
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Journal Code:G0124A
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ISSN:0454-1146
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VOL.28;NO.3;PAGE.123-129(1999)
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| Figure&Table&Reference;FIG.6, TBL.1, REF.18 |
| Pub. Country;Japan |
| Language;Japanese |
| Abstract;Recent advance on X-ray fluorescence, diffraction and absorption analyses of the earth and planetary materials using synchrotron radiation were overviewed. SR-XRF technique is suitable for nondestructive trace element analysis and chemical state analysis of the geological samples. Utilization of X-ray microbeam also allows us to carry out two-dimensional analysis of trace elements in ppm level in a few micron regions. Characteristics of the SR-XRF techniques were illustrated through the application of the methods to lunar rocks, cosmic dusts, and Banded Iron Formation. New features of the 3rd generation SR light source, SPring-8, and its perspective are described. (author abst.) |
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