Analysis of X-ray Emission from Caesium Sputter Ion Source by EGS4 Simulation.
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Accession number;99A1045411
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| Title;Analysis of X-ray Emission from Caesium Sputter Ion Source by EGS4 Simulation. |
| Author;
KAWANISHI T
(Univ. Tokyo, Tokyo, Jpn)
SUGIURA N
(Univ. Tokyo, Tokyo, Jpn)
KOSAKO T
(Univ. Tokyo, Tokyo, Jpn)
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Journal Title;Proc Symp Accel Sci Technol
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Journal Code:F0512B
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ISSN:0914-2789
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VOL.12th;NO.;PAGE.132-134(1999)
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| Figure&Table&Reference;FIG.6, TBL.1, REF.8 |
| Pub. Country;Japan |
| Language;English |
| Abstract;The dose rate around 1.7MV tandetron accelerator was measured. High dose rates of X-ray were detected from a ceasium sputter ion source. The dose rate was the order of 10.MU.Sv/hr. The spectrum of this X-ray has a peak at 25.8keV. This X-ray showed directivity. This X-ray is considered as the bremsstrahlung, which is generated by the collision of electron to extraction electrode. This situation was simulated and analysed by EGS4 code. X-ray emission from extraction electrode was found in all directions and the energy spectrum. After passing the wall of ion source, 1mm thickness of SUS304, the energy spectrum showed a single peak, which range was from 20 to 25keV. It is thought that the generation mechanism of X rays could be confirmed analytically. (author abst.) |
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