Phase transition of CuGaTe2 semiconductor under pressure.

Accession number;02A0335469
Title;Phase transition of CuGaTe2 semiconductor under pressure.
Author; MORI YOSHIHISA (Okayama Univ. of Sci.) IKAI TOMOYUKI (Okayama Univ. of Sci.) ASANO NORIO (Okayama Univ. of Sci.) KOIKE YASUHIRO (Okayama Univ. of Sci.) TAKARABE YASUHIRO (Okayama Univ. of Sci.)
Journal Title;Program and Abstracts of Papers. High Pressure Conference of Japan
Journal Code:L1222A
ISSN:0917-6373
VOL.42nd;NO.;PAGE.52(2001)
Figure&Table&Reference;FIG.2, REF.3
Pub. Country;Japan
Language;Japanese
Abstract;High pressure X-ray diffraction measurements were performed on CuGaTe2 chalcopyrite semiconductor up to 18 GPa. The first phase transition occurred at 9.4 GPa, and this new phase was tentatively assigned to a cation disordered zinc-blende (d-ZB) structure. Moreover, the d-ZB phase transformed to a disordered NaCl (d-NaCl) structure at 15.4 GPa. The phase transition from the chalcopyrite to the tentative d-ZB phase was accompanied by a volume reduction of 5 %. On the other hand, the volume reduction from the d-ZB to the d-NaCl phase was 7 %. (author abst.)