Quality evaluation of CdTe/Si(111) grown by hot wall epitaxy.
|
Accession number;03A0279979
|
| Title;Quality evaluation of CdTe/Si(111) grown by hot wall epitaxy. |
| Author;
LALEV G
(Tohoku Univ.)
WANG J
(Tohoku Univ.)
ABE S
(Res. Inst. Electric And Magnetic Materials, Sendai, Jpn)
MASUMOTO K
(Res. Inst. Electric And Magnetic Materials, Sendai, Jpn)
ISSHIKI M
(Tohoku Univ.)
|
Journal Title;Abstracts. Meeting of JIM
|
Journal Code:S0988A
|
ISSN:1342-5730
|
|
VOL.132nd;NO.;PAGE.418(2003)
|
| Figure&Table&Reference; |
| Pub. Country;Japan |
| Language;English |
| Abstract; |
|
|
|
Related Articles;
|
|
