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Accession number;03A0493404
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| Title;Development of a System for Measuring High-Frequency Magnetic Fields and Currents of LSIs and PCBs |
| Author;
MASUDA N
(Nec Corp.)
TAMAKI N
(Nec Corp.)
KURIYAMA T
(Nec Corp.)
WATANABE T
(Nec Electronics Corp.)
SHIMASAKI T
(Nec Engineering, Ltd.)
SHIRATORI Y
(Nec Engineering, Ltd.)
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Journal Title;NEC Res Dev
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Journal Code:G0138A
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ISSN:0547-051X
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VOL.44;NO.3;PAGE.241-245(2003)
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| Figure&Table&Reference;FIG.4, TBL.1, REF.5 |
| Pub. Country;Japan |
| Language;English |
| Abstract;NEC and NEC Engineering, Ltd. have developed a system for measuring high-frequency magnetic fields and currents. This system uses miniature magnetic-field probes with a maximum spatial resolution of 250.MU.m at a 6dB degrading point, which enable the measurement of magnetic fields in close proximity to LSIs and dense-printed circuit boards (PCBs). We have also developed a new software library for calculating the current from the magnetic field over a microstrip line. The library contains a subroutine based on the magnetic probe (MP) method, for which the international standard (IS) was released in June 2002. The system measures at each lead of an LSI package and the trace on a PCB, and therefore can be used to improve simulated LSI models and to verify PCB designs. The system is commercially available from NEC Engineering, Ltd. (author abst.) |
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