Science Links Japan | Development of an Apertureless Near-Field Optical Microscope for Nanoscale Optical Imaging at Low Temperatures

Development of an Apertureless Near-Field Optical Microscope for Nanoscale Optical Imaging at Low Temperatures

Accession number;05A0303253

Title;Development of an Apertureless Near-Field Optical Microscope for Nanoscale Optical Imaging at Low Temperatures

Author; TANIGUCHI K (Nara Inst. Of Sci. And Technol., Nara, Jpn) KANEMITSU Y (Nara Inst. Of Sci. And Technol., Nara, Jpn)

Journal Title;Jpn J Appl Phys Part 1

Journal Code:G0520B

ISSN:0021-4922

VOL.44;NO.1B;PAGE.575-577(2005)

Figure&Table&Reference;FIG.4, REF.16

Pub. Country;Japan

Language;English

Abstract;We have developed an apertureless scanning near-field optical microscope (apertureless SNOM) operating at low temperatures. The apertureless SNOM system is based on the atomic force microscope using a frequency modulation detection technique. The SNOM images reflect local optical properties of the sample surface, and optical images of a ferroelectric material are successfully obtained at low temperatures below a Curie temperature. The SNOM system developed in this work is a powerful tool to image local fields on the sample surface and to study phase transitions under high spatial resolution. (author abst.)

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