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Accession number;07A0043248
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| Title;SOURCE OF UNCERTAINTY OF SPECIFIC HEAT MEASUREMENT BY DSC AND EVALUATION BY FLASH METHOD |
| Author;
SHINODA YOSHIO
(Buruka・eiekkusuesu)
KOBAYASHI HIROSHI
(Buruka・eiekkusuesu)
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Journal Title;Thermophys Prop
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Journal Code:X0031A
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ISSN:0911-1743
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VOL.27th;NO.;PAGE.136-138(2006)
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| Figure&Table&Reference;FIG.7, REF.2 |
| Pub. Country;Japan |
| Language;Japanese |
| Abstract;The determination of specific heat (Cp) is one of the important applications of differential scanning calorimeter (DSC). As a manufacturer and distributor of DSC apparatus, we are frequently asked for the uncertainty of obtained specific heat. This is especially important, if it is used for the calculation for thermal conductivity. In the present work, we evaluated the uncertainty of specific heat measured by NETZSCH DSC 204 F1/u-sensor for various area and thickness of sapphire reference samples. We also evaluated the effect of stacking samples and crimping crucibles to Cp measurement with DSC. The contact resistance between stacked samples as well as sample and crimped crucible was measured using Xenon flash analyzer NETZSCH LFA 447 Nanoflash. (author abst.) |
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