A SIMULTANEOUS MEASUREMENT TECHNIQUE FOR SPECTRA OF HEMISPHERICAL REFLECTANC AND EMITTANCE OF THERMAL RADIATION
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Accession number;07A0043253
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| Title;A SIMULTANEOUS MEASUREMENT TECHNIQUE FOR SPECTRA OF HEMISPHERICAL REFLECTANC AND EMITTANCE OF THERMAL RADIATION |
| Author;
UGAI KEN
(Kyoto Univ., JPN)
WAKABAYASHI HIDENOBU
(Kyoto Univ., JPN)
MAKINO TOSHIRO
(Kyoto Univ., JPN)
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Journal Title;Thermophys Prop
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Journal Code:X0031A
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ISSN:0911-1743
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VOL.27th;NO.;PAGE.151-153(2006)
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| Figure&Table&Reference;FIG.4, REF.3 |
| Pub. Country;Japan |
| Language;Japanese |
| Abstract;In the present study, we are developing a simultaneous measurement technique for spectra of hemispherical reflectance and emittance of thermal radiation. The purpose of the present study is the following: first we try verification of the Kirchhoff's law (.EPSILON.N+RNH=1) in the wavelength region of 1.1-11.MU.m, and second if the verification can be succeed, we can measure the spectral normal emittance .EPSILON.N (=1-RNH) through the measurement of the spectral normal incidence hemispherical reflectance RNH at every moment in the wavelength region of 0.30-11.MU.m. In actual development/improvement of the spectrophotometer system, the following procedure is adopted: RNH is equal to the spectral hemispherical-incident normal reflectance RNH, but since considering connection of a new optics for measuring hemispherical reflection which will be developed in the present study with the wide-spectral high-speed spectrophotometer system with it is more advantageous to measure RHN rather than to measure RNH, we will aim at simultaneous measurement of spectra of RHN and .EPSILON.N. As the result, at the present stage, the wide-spectral high-speed spectrophotometer system with which the optics for measuring hemispherical reflection can measure it is possible that the spectral hemispherical-incident normal reflectance RHN (=RNH) and the spectral normal emittance .EPSILON.N in the wide wavelength region of 0.30-11.MU.m simultaneously at every 4s. (author abst.) |
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