THERMAL AND ELECTRICAL CONDUCTIVITIES OF METALLIC NANOFILMS
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Accession number;07A0043214
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| Title;THERMAL AND ELECTRICAL CONDUCTIVITIES OF METALLIC NANOFILMS |
| Author;
FUJII MOTOO
(Kyushu Univ., JPN)
ZHANG XING
(Tsinghua Univ., CHN)
TAKAHASHI KOJI
(Kyushu Univ., JPN)
ZHANG QING-GUANG
(Tsinghua Univ., CHN)
TANAKA SHUJI
(Kyushu Univ., Graduate School, JPN)
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Journal Title;Thermophys Prop
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Journal Code:X0031A
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ISSN:0911-1743
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VOL.27th;NO.;PAGE.36-38(2006)
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| Figure&Table&Reference;FIG.5, TBL.1, REF.5 |
| Pub. Country;Japan |
| Language;Japanese |
| Abstract;The surface and grain-boundary effects on the in-plane electrical and thermal conductivities of polycrystalline metallic nanofilms have been investigated. The thicknesses of the platinum nanofilms range from 15.0nm to 63.0nm and the mean grain sizes measured by X-ray diffraction vary from 9.5nm to 26.4nm. The electrical conductivities and the thermal conductivities of the nanofilms measured by a direct electrical heating method are both greatly reduced from the bulk values. The measured results are compared with the values predicted by the Kumar and Vradis' theory and others. It is found that the reduction in the thermal conductivity is mainly caused by grain-boundary scattering and the reflection coefficient of electrons striking the grain boundaries is examined. The relaxation time model is also applied to study the size effects to check whether the Matthiessen rule is still valid in predicting the in-plane thermal conductivity of polycrystalline metallic nanofilms. The results indicate that by considering only grain-boundary scattering and background scattering the Matthiessen rule is still valid. If surface scattering, however, is included, deviations of the Matthiessen rule from other theories mentioned above have been found. (author abst.) |
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