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List of Journal Titles (2)
> 2002 Int Conf Simul Semicond Process Divice
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2002 Int Conf Simul Semicond Process Divice
Perspectives in Microscopic Carrier Transport
Integrated TCAD and ECAD Solutions-A Paradigm Shift
Coupled-Field Modeling of Microdevices and Microsystems
Surface Mobility in Silicon at Large Operating Temperature
Simulation of DGSOI MOSFETs with a Schroedinger-Poisson Based Mobility Model
Ensemble Monte Carlo/Molecular Dynamics Simulation of Inversion Layer Mobility in Si MOSFETs-Effects of Substrate Impurity
Investigation of the Electron Mobility in Strained Si1-xGex at High Ge Composition
A Strategy for Enabling Predictive TCAD in Development of sub-100nm CMOS Technologies
On the Optimal Shape and Location of Silicided Source and Drain Contacts
GIDL Simulation and Optimization for O.13.MU.m/1.5V Low Power CMOS Transistor Design
TCAD Driven Drain Engineering for Hot Carrier Reduction of 3.3V I/O PMOSFET
Circuit-Simulation Model of Gate-Drain-Capacitance Changes in Small-Size MOSFETs Due to High Channel-Field Gradients
2D Simulation of a Buried-Heterostructure Tunable Twin-Guide DFB Laser Diode
A Comprehensive Simulation Study of Strained-Si/SiGe nMODFET Scaling for RF Applications
Realistic Scaling Scenario for Sub-100nm Embedded SRAM Based on 3-Dimensional Interconnect Simulation
On the Large-Signal CMOS Modeling and Parameter Extraction for RF Applications
Drift-Diffusion-Based Modeling of the Non-Quasistatic Small-Signal Response for RF-MOSFET Applications
THE PHYSICAL PHENOMENA RESPONSIBLE FOR EXCESS NOISE IN SHORT-CHANNEL MOS DEVICES
Simulation of Substrate Currents
Multiscale Simulation of Diffusion, Deactivation, and Segregation of Dopants-Ab-Initio to Continuum
Integrated Atomistic Process and Device Simulation of Decananometre MOSFETs
3D MOSFET Simulation Considering Long-Range Coulomb Potential Effects for Analyzing Statistical Dopant-Induced Fluctuations Associated with Atomistic Process Simulator
Transistor Width Dependence of LER Degradation to CMOS Device Characteristics
Enhanced Advancing Front Delaunay Meshing in TCAD
In-Advance CPU Time Analysis for Monte Carlo Device Simulations
An Efficient Algorithm for 3D Interconnect Capacitance Extraction Considering Floating Conductors
System Level Model of Damping Effects for Highly Perforated Torsional Microstructures
A Novel CDM-like Discharge Effect During Human Body Model (HBM) ESD Stress
Simulation Technique of Heating by Contact Resistance for ESD Protection Device
Atomistic Simulation of RTA Annealing for Shallow Junction Formation characterizing both BED and TED
Three-dimensional Triangle-based Simulation of Etching Processes
Automatic Order Reduction of Thermo-Electric Model for Micro-Ignition Unit
Numerical modeling of silicon film deposition in very-high-frequency plasma reactor
Gate tunnelling and impact ionisation in sub 100 nm PHEMTs
Extraction of 3D interconnect impedances using edge elements without gauge condition
Impact of electron heat conductivity on electron energy flux
Modeling of Ultra Shallow Junctions and Hybrid Source/Drain Profiles Annealed by Soak and Spike RTA
Investigation of Magnetic Field Effects on Energy Gap for Nanoscale InAs/GaAs Semiconductor Ring Structures
Self-Consistent Single-Particle Simulation
Nanoelectronic 3-D (NEMO 3-D) Simulation of Multimillion Atom Quantum Dot Systems
Characterization of Multi-Barrier Tunneling Diodes and Vertical Transistors using 2-D Device Simulation
Hot-Carrier Energy Distribution Model and Its Application to the MOSFET Substrate Current
Numerical simulation of a two-particle wave function in quantum wires
Cross Validation of Quantum Simulations and Optical Measurements in Single Electron Memories with Silicon Nano-crystallites
A Strategy to Enforce the Discrete Minimax Principle on Finite Element Meshes
Wigner Transport through Tunneling Structures-Scattering Interpretation of the Potential Operator
Simulation and Inverse Modeling of TEOS Deposition Processes Using a Fast Level Set Method
Simulation of a "Well Tempered" SOI MOSFET using an Enhanced Hydrodynamic Transport Model
Statistical Fluctuation Analysis by Monte Carlo Ion Implantation Method
Bias-dependent drift resistance modeling for accurate DC and AC simulation of asymmetric HV-MOSFET
A New Non-Pair Diffusion Based Dopant Pile-Up Model for Process Designers and Its Prediction Accuracy
The Process Modeling Hierarchy: Connecting Atomistic Calculations to Nanoscale Behavior
Monte Carlo Simulation of Consecutive Implants into SiO2 Capped Si
Modeling of the Diffusion of Implanted Boron in Strained Si/Si1-xGex
Technology Modeling for Emerging SOI Devices
MOSFET Hot-Carrier Induced Gate Current Simulation by Self-Consistent Silicon/Oxide Monte Carlo Device Simulation
A New Gate Current Model Accounting for a Non-Maxwellian Electron Energy Distribution Function
Analysis of injection current with electron temperature for High-K gate stacks
Hot carrier induced degradation due to multi-phonon mechanism analyzed by lattice and device Monte Carlo coupled simulation
Finite Element Analysis of Stress Evolution in Si based Front and Back Ends Micro Structures
An Adaptive Grid Approach for the Simulation of Electromigration Induced Void Migration
A New SP(Simultaneous Polishing) Model for Copper CMP Process
Quantum Transport Modeling in Nano-Scale Devices
Simulation of direct source-to-drain tunnelling using the density gradient formalism: Non-equilibrium Green's function calibration
Simulations of Ultrathin, Ultrashort Double-Gated MOSFETs with the Density Gradient Transport Model
On Density-Gradient Modeling of Tunneling through Insulators
Monte Carlo Simulation of Electron Transport in a Carbon Nanotube
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