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Xsen Bunseki Toronkai Koen Yoshishu

37th

Synchrotron radiation excited X-ray fluorescence Analysis at the Photon Factory. Past, present and future.
Recent research related to the polarization and/or phase of SR.
Review of recent X-ray detectors.
X-Ray diffraction studies on surfaces and interface.
Grazing-incidence Small-angle Scattering experiment of thin films and granular materials.
Development of a Bulk Type Superconducting X-ray Detector.
WD/TXRF Analysis of ultra low concentration elements at SPring-8 BL40XU.
Nondestructive whole-surface analysis of silicon wafers by the use of TXRF.
Development of The X-ray Fluorescence Spectrometer utilized The Synchrotron radiation of SPring-8 for the Scientific criminal investigation.
On W L.BETA. visible satellite.
Development and evaluation of a new XAFS cell system for soft X-ray spectral measurement of solutions.
Design and manufacture of a rotating-type four-quadrant X-ray phase-retarder system.
X-Ray Fluorescence Spectroscopic Analysis of Abnormal Shaped Film Samples Corrected with Rayleigh Theoretical Intensity Scattering Method.
Monochromatic X-Ray Excitation Fluorescence Analysis. Evaluation of Uncertainty of Fe-Cr Alloy in Fundamental Parameter Method.
Measurement of .GAMMA./.GAMMA.' lattice misfit and lattice distortion in Ni-base superalloys.
Possibility of a new X-ray spectroscopy using positron annihilation.
Studies on Inner Shell Ionization by means of Positron Irradiation.
LEELS study of DLC films.
In situ observation of surface melting of Si(001) surface.
Characterzation of Al Thin Film Crystal Structure for Magnetic Under Layer.
Determination of Particle/Pore Size Distribution in Thin Films by Reflection Geometry Small Angle X-Ray Scattering.
X-ray Reflectometry of Periodic Silver Nanoparticles Multilayer.
Characterization of self-assembled ultrathin film of titania nanosheets.
Characterization of Ultra-fast X-ray Detector for Powder Diffraction.
Development of 30cm2 area CSPC (Xe gas).
On-Site Analysis of artifacts excavated in Sinai Peninsula by a New Portable X-ray Fluorescence Spectrometer equipped with Two Monochromatic Excitation Sources and SDD.
2D elemental analysis using a full-field x-ray fluorescence microscope and a CCD Camera.
X-ray Fluorescence Movie.
Total-electron-yield x-ray standing-wave measurements of multilayer x-ray mirrors for the interface structure evaluation.
Soft x-ray emission and absorption spectra in the O K region of aromatic compounds substituted with oxygenated functional groups.
Energy Dispersive X-ray Fluorescence Analysis of Environmental Samples.
Determination of trace metals in plastics by X-ray fluorescence spectrometry.
Intensity analysis for Grazing-Exit EPMA of thin-films.
Status of a beamline for X-ray reflectivity measurement.
A new beamline for spectromicroscopy at SPring-8.
Application of high-energy X-ray fluorescence analysis to archaeometric analysis of old Kutani china wares.
XAFS study of iron(III) hydroxides.
Temperature dependency of BaTiO3 by high-resolution parallel-beam optics using laboratory X-ray source.
X-ray fluorescence holography using multi-element SSD.
Symmetric x-ray reflection pattern.
Monochromatic X-ray Excitation Fluorescence Analysis. Toward the SI Traceable Method.
Simultaneous Determination of Film Thickness and Composition of Pb-Free Solder Layer by .MU.XRF.
Ultra-light elements analysis by .MU.XRF.
Application of digital signal processing for PIN diode detector system.
Ultra-trace element analysis on compound semiconductor wafer using WD-TXRF with a high flux SR.
X-ray State Analysis of VK.BETA. lines Induced by Electron Impact.
X-ray Polarization-Contrast Imaging.
K-XAFS study on implanted arsenic in silicon using a 19-element solid state detector.
Incident Position Dependency of Superconducting Series-Junction Detector.
Search and display possible interfering lines.
Imaging analysis on superconducting x-ray detectors by Low Temperature Scanning Synchrotron Microscope.
Clarification of mechanism in photocaralytic reaction by totally reflected X-ray in-plane diffraction.
Experimental production and usability of refraction-transmission type X-ray filter.
Evaluation of Si(Li) detectors by a combination of the copper staining method and X-ray analytical microscopy.
X-ray reflectivity for graded surfaces: Calculations.
New Capabilities and Applications of Compact Source-Optic Combinations.
Chemical effects observed in MnK.BETA. X-ray fluorescence spectra.