Science Links Japan | Xsen Bunseki Toronkai Koen Yoshishu

List of Jounal Titles

A to Z index of Journal Title. Choose a letter.

A/ B/ C/ D/ E/ F/ G/ H/ I/ J/ K/ L/ M/ N/ O/ P/ Q/ R/ S/ T/ U/ V/ W/ X/ Y/ Z/ 0/ 1/ 2/ 3/ 4/ 5/ 6/ 7/ 8/ 9

Xsen Bunseki Toronkai Koen Yoshishu

39th

Complete Characterization of Implanted Si-wafers Studied by Repeated Planar Sputter-Etching and Total Reflection X-ray Fluorescence Analysis
Trace elements distribution and post-mortem intake in human bones from Middle Age by TXRF
Characterization of Nano-structures of Porous Silica Thin Films by Grazing Incidence X-ray Scattering Method
TXRF analysis of environmental samples
Progress of Microfocus X-ray Technologies and It's Industrial Applications
THE CAPABILITIES OF TOTAL REFLECTION X-RAY FLUORESCENCE IN THE POLYMER ANALYTICAL FIELD
SUPER MIRROR FOR TXRF OPTICS
New applications and results from the SR-TXRF facility at SSRL
Improvement of light elements analysis in VPD-TXRF
Discovery of a new element "Nipponium": Re-evaluation of pioneering works of Masataka Ogawa and his son Eijiro Ogawa
CHARACTERIZATION OF URBAN AIR POLLUTION BY TOTAL REFLECTION X-RAY FLUORESCENCE
TXRF of trace impurities on semiconductor wafers using third generation synchrotron radiation
Characterization of Beers by Synchrotron Radiation Total Reflection X-Ray Fluorescence Analysis
Application of Total Reflection X-ray Photoelectron Spectroscopy to Thin Film Surface
Analysis of depth profile for impurity concentration in Si wafer by Synchrotron Radiation Excited Total Reflection X-ray Fluorescence Spectroscopy
Theory of X-Ray Emission and Absorption Spectra
Censoring: a new approach for detection limits in TXRF
Characterization of Semiconductor Samples with Total Reflection X-ray Fluorescence Analysis
Total Reflection XAFS on Liquid Surface
DIRECT ANALYSIS OF BIOLOGICAL SAMPLES BY TXRF
Quick X-Ray Fluorescence Imaging: A New Scientific Tool
The experimental background and the model description for the waveguide-resonance propagation of X-ray radiation in planar narrow extended slit
Scanning X-ray microscope coupled with transmitted X-rays imaging and X-ray fluorescent X-ray imaging
Total reflection X-ray fluorescence spectrometric determination of element inlets from mining activities at the Tisza catchment area, Hungary
Inexpensive and precise TXRF spectrometer: construction and its applications
NEW DEVELOPMENTS AND ENVIRONMENTAL APPLICATIONS OF XRS
Arsenic Ultra Shallow Junction Characterisation by TXRF and SIMS.
A novel gas-filled detector for pulsed X-ray sources
ANALYSIS OF LEAD IN BLOOD SAMPLES BY TXRF: MODIFICATION OF THE "A. PRANGE" PROCEDURE.
DETERMINATION OF METALS IN COFFEE BY TOTAL REFLECTION X-RAY FLUORESCENCE ANALYSIS
The Dynamics of the Nucleation and Growth processes of Copper Nanoparticles on Silicon Surfaces
A Laser Plasma X-ray Source for the Analysis of Wafer Surfaces by Grazing Emission X-Ray Fluorescence Spectrometry
NANOLITER DROPLET SAMPLE PREPARATION WITH TXRF ANALYSIS
Analysis of polymer TXRF spectra
Recent Activity of ISO TC201 WG2-Direct-TXRF Aiming at the Surface Metal Contamination of less than 1010 atoms/cm2-
Analysis of suspended particulate matter using total reflection x-ray fluorescence spectrometer
Recent Developments in Low Power TXRF-Spectrometer Technique
Microstructure of Carbon Films on the Japanese Smoked Roof Tile "Ibushi-Kawara" Characterized by Angle-Dependent Soft X-ray Spectroscopy
Validation of Vapor Phase Decomposition-Total Reflection X-Ray Fluorescence Spectrometry for Metallic Contamination Analysis of Si Wafers
XANES from ReflXAFS under grazing incidence conditions
A NEW TXRF VACUUM CHAMBER WITH SAMPLE CHANGER USING A SILICON DRIFT DETECTOR FOR CHEMICAL ANALYSIS
Study on deposition kinetics of high-k materials by X-ray fluorescence techniques
TXRF Analysis of Pollen as an Indicator for Atmospheric Pollution
The tunneling of X-ray radiation in the composite waveguide-resonator
Peculiarities of TXRF spectrometry in condition of the waveguide-resonator application
HEAVY METALS DETERMINATION IN FISH USING TOTAL REFLECTION WITH SYNCHROTRON RADIATION
Saturation Effects in Total Reflection X-Ray Fluorescence Spectrometry on Micro-Droplet Samples
PTB facility for contamination and deposition control on 200mm and 300mm silicon wafers employing Total-Reflection X-ray Fluorescence analysis in the soft X-ray regime
WD-GIXRF of multilayer thin films
Nanoarchitecture of Semiconductor Titania Nanosheets Revealed by Polarization-Dependent Total Reflection Fluorescence XAFS
The use of a portable total reflection X-ray fluorescence spectrometer for trace element determination in freshwater microcrustaceans (Daphnia)
IDENTIFICATION OF NANOPARTICLE ON WAFER USING XRF
F K Fluorescence Spectra and Absorption spectra of Rare Earth Fluorides, BaF2 and HfF4
Application of synchrotron radiation and TEM/EDX for elemental micro analysis of embryonic stem cells
X-ray analysis of individual particle with combination of Scanning Electron Microscope and Synchrotron Radiation
Development and performances of a multi-energy high power X-ray generator for high performance X-ray photoelectron diffraction
The electronic states analysis of porphyrin compounds using soft X-ray spectroscopy
Orientation effect of graphitic crystallite on the x-ray emission spectra and the structure of surface carbons of smoked roof tile, "Ibushi Kawara"
Investigation of probing depth with the X-ray excited sample current detection under atmospheric condition
DEPENDENCE OF CONTAMINATION FORM WITH QUANTITATIVE ANALYSIS FOR VPD-TXRF
Detection of Unknown Localized Contamination on Silicon Wafer Surface by Sweeping-TXRF
A compact Johansson X-Ray Fluorescence Spectrometer with R=100mm
Droplet Preparation from Natural Water for TXRF analysis using Johansson WD-spectrometer
Production and estimation of Doubly-Curved-Crystal using Si single crystal
Positive electrode Positive Electrode Materials of Lithium-ion Rechargeable Battery by Means of XPS excited by Ultra Soft X-ray
Comparison of SiLi detector and Silicon drift detector for the determination of Low Z elements in TXRF